权威例句
...by Kathleen Hall Jamieson; Joseph N. Cappellaa CAPpella: programming by demonstration of context-aware applicationsComparative Analysis of A Cappella Flamenco CantesForce measurements with the atomic force microscope: Technique, interpretation and applicationsForce Measurements with Atomic Force Microscope: Technique, Interpretation and ApplicationsFirst results from DAMA/LIBRA and the combined results with DAMA/NaIA 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 10...Force-distance curves by atomic force microscopyNew results from DAMA/LIBRAA 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 10...
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